{"title":"Phenomenon of anomalous diffraction radiation in the metal-dielectric grating","authors":"A. Tsvyk, L. I. Tsvyk","doi":"10.1109/CRMICO.2002.1137202","DOIUrl":null,"url":null,"abstract":"Conditions for occurrences of a diffraction radiation (DR) exclusively into the dielectric of metal-dielectric grating (we have named this phenomenon an anomalous DR or ADR) are shown and analyzed. Contrary to the Cerenkov radiation, an ADR may occur at ultra low electron velocities (/spl beta//spl Lt/1//spl radic//spl epsi/). Electromagnetic field, energy density and other characteristics of the ADR are found as the exact solution of the strict mathematical task. A number of ADR characteristics have been calculated. The use of the ADR phenomenon is suggested for the miniaturization of diffraction electronic devices, e.g. in the design of semiconductor oscillators.","PeriodicalId":378024,"journal":{"name":"12th International Conference Microwave and Telecommunication Technology","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"12th International Conference Microwave and Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2002.1137202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Conditions for occurrences of a diffraction radiation (DR) exclusively into the dielectric of metal-dielectric grating (we have named this phenomenon an anomalous DR or ADR) are shown and analyzed. Contrary to the Cerenkov radiation, an ADR may occur at ultra low electron velocities (/spl beta//spl Lt/1//spl radic//spl epsi/). Electromagnetic field, energy density and other characteristics of the ADR are found as the exact solution of the strict mathematical task. A number of ADR characteristics have been calculated. The use of the ADR phenomenon is suggested for the miniaturization of diffraction electronic devices, e.g. in the design of semiconductor oscillators.