Schmitt-Trigger-Based Low Power SRAM Implemented Using 45-nm CMOS Technology

Rochelle B. Oruga, Camille Valerie D. Dimalibot, Jolina May D. Matibag, Francine Cyrill R. Gregori, Ralph Gerard B. Sangalang
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Abstract

This paper presents a Schmitt-trigger-based SRAM with a separated read port, which significantly improves read static noise margin (RSNM) and consumes low energy. Post-layout simulation results show that the proposed design performed better than the conventional 6T SRAM cell. The SNM of the designed cell is 1.16 mV higher than the conventional 6T SRAM cell in write mode, and 232.37 mV and 207.46 mV in read mode 1 and 0, respectively. The impact of the process, voltage, and temperature variations on cell performance parameters such as read, write and hold SNM, power per access, power per bit, delay, and energy per bit was investigated. Aside from this, the DNM of the cell was also measured to determine the noise tolerance of the cell during the write operation. Monte Carlo simulation results verified how robust the proposed cell is. The design was implemented in a 45-nm technology in which the cell occupies 4.53×4.53 µm2 and the system is 568.55×568.55 µm2. This cell consumes only 0.396 fJ, which is lower than the energy per bit consumed on the 6T conventional cell which is 7.265 fJ. All-corner simulation results show that the proposed cell is suitable for low-power applications.
采用45纳米CMOS技术实现的基于施密特触发器的低功耗SRAM
本文提出了一种基于施密特触发器的SRAM,该SRAM具有独立的读端口,显著提高了读静态噪声余量(RSNM),并且能耗低。布局后仿真结果表明,该设计比传统的6T SRAM单元性能更好。所设计的单元在写入模式下的SNM比传统的6T SRAM单元高1.16 mV,在读取模式1和0时的SNM分别为232.37 mV和207.46 mV。研究了工艺、电压和温度变化对电池性能参数的影响,如读、写和保持SNM、每次访问功率、每比特功率、延迟和每比特能量。除此之外,还测量了电池的DNM,以确定电池在写入操作期间的噪声容忍度。蒙特卡罗仿真结果验证了所提单元的鲁棒性。该设计采用45纳米技术,其中电池占地4.53×4.53µm2,系统占地568.55×568.55µm2。该电池仅消耗0.396 fJ,低于6T传统电池消耗的每比特能量7.265 fJ。仿真结果表明,该单元适用于低功耗应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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