Using the nonlinear property of FSR and dictionary coding for reduction of test volume

Abstract

Using the nonlinear feedback shift register in testing is known to create a test set for combinational circuits instead of using the deterministic test set. The nonlinear property of feedback shift register is used differently here to reduce the test data volume for combinational circuits without using the nonlinear feedback shift register. In addition, a dictionary coding method is applied to further decrease a reduced test set. Results with benchmark circuits show a great improvement in the reduction of test data volume.