Scanning probe microscope trajectory measurement by scanning a single feature

James C. Peyton Jones, G. Clayton
{"title":"Scanning probe microscope trajectory measurement by scanning a single feature","authors":"James C. Peyton Jones, G. Clayton","doi":"10.1109/AIM.2015.7222577","DOIUrl":null,"url":null,"abstract":"In this paper, a method for estimating scanning probe microscope (SPM) trajectories using only the probe-surface interaction signal is presented. The novelty of this approach is that the trajectory estimate can be made by scanning over one feature. SPMs are perhaps the most important devices for nanotechnology because of their unrivaled ability to measure, manipulate, and modify surfaces at extremely high resolution. Although widely used, SPM operating speed is limited. In order to increase operating speed, SPM trajectory measurement is useful to enable control and modeling, but the sensors required to make those measurements are not always available due to various sensor issues. The probe-surface interaction signal-based probe trajectory estimation technique in this paper overcomes issues associated with conventional sensors by using the existing probe-surface interaction measurement capabilities of SPM systems. The presented method analyzes probe-surface interactions from one feature on the sample's surface to determine a set of probe trajectory zero crossings. This set can be used to estimate the probe trajectory through a nonlinear least squares fit. In order to show the validity of this approach, proof-of-concept simulations are presented.","PeriodicalId":199432,"journal":{"name":"2015 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)","volume":"355 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIM.2015.7222577","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In this paper, a method for estimating scanning probe microscope (SPM) trajectories using only the probe-surface interaction signal is presented. The novelty of this approach is that the trajectory estimate can be made by scanning over one feature. SPMs are perhaps the most important devices for nanotechnology because of their unrivaled ability to measure, manipulate, and modify surfaces at extremely high resolution. Although widely used, SPM operating speed is limited. In order to increase operating speed, SPM trajectory measurement is useful to enable control and modeling, but the sensors required to make those measurements are not always available due to various sensor issues. The probe-surface interaction signal-based probe trajectory estimation technique in this paper overcomes issues associated with conventional sensors by using the existing probe-surface interaction measurement capabilities of SPM systems. The presented method analyzes probe-surface interactions from one feature on the sample's surface to determine a set of probe trajectory zero crossings. This set can be used to estimate the probe trajectory through a nonlinear least squares fit. In order to show the validity of this approach, proof-of-concept simulations are presented.
扫描探针显微镜通过扫描单个特征来测量轨迹
本文提出了一种仅利用探针表面相互作用信号估计扫描探针显微镜(SPM)轨迹的方法。这种方法的新颖之处在于,轨迹估计可以通过扫描一个特征来完成。spm可能是纳米技术中最重要的设备,因为它们具有无与伦比的以极高分辨率测量、操纵和修改表面的能力。SPM虽然应用广泛,但运行速度有限。为了提高作业速度,SPM轨迹测量有助于实现控制和建模,但由于各种传感器问题,进行这些测量所需的传感器并不总是可用的。本文提出的基于探针-表面相互作用信号的探针轨迹估计技术,利用SPM系统现有的探针-表面相互作用测量能力,克服了传统传感器存在的问题。该方法从样品表面的一个特征分析探针与表面的相互作用,以确定一组探针轨迹的零交叉。该集合可以通过非线性最小二乘拟合来估计探测轨迹。为了证明该方法的有效性,给出了概念验证仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信