A novel protection technique devoted to the improvement of the short circuit ruggedness of IGBTs

IECON'03. 29th Annual Conference of the IEEE Industrial Electronics Society (IEEE Cat. No.03CH37468) Pub Date : 2003-11-02 DOI:10.1109/IECON.2003.1280319

S. Musumeci, R. Pagano, A. Raciti, G. Belverde, C. Guastella, M. Melito

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引用次数: 21

Abstract

This paper deals with a novel short circuit protection technique that is applied during fault under load (FUL) conditions occurring on IGBT devices. An experimental analysis of rugged IGBTs, which are submitted to FUL transients, has been performed dwelling upon the main stresses associated with the fault. In particular, the issues pertinent to the current transient are analysed, and the state-of-the-art regarding the protection circuit as appearing in literature is recalled and discussed. A novel circuitry is proposed aiming to strongly limit the peak of current deriving from a FUL transient, thus limiting the considerable energetic and thermal stresses onto the device. Besides, a theoretical analysis explaining the working mechanism of the proposed circuit has been carried out. Finally, the experimental results, which have been obtained by exploiting a suitable breadboard able to create FUL transients, confirm the validity and correctness of the proposed approach.

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一种新的保护技术，致力于提高igbt的短路坚固性

本文研究了一种适用于IGBT器件负载故障时的新型短路保护技术。对已提交到FUL瞬态的坚固型igbt进行了实验分析，并对与故障相关的主要应力进行了分析。特别是，与电流暂态相关的问题进行了分析，并回顾和讨论了文献中出现的有关保护电路的最新进展。提出了一种新的电路，旨在强烈限制从FUL瞬态产生的电流峰值，从而限制了器件上可观的能量和热应力。此外，还对该电路的工作机理进行了理论分析。最后，利用一种合适的面包板实现了FUL瞬变，实验结果验证了所提方法的有效性和正确性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IECON'03. 29th Annual Conference of the IEEE Industrial Electronics Society (IEEE Cat. No.03CH37468)

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