Operational Risk in Semiconductor Fabrication Using Binary Classification Algorithms and Monte Carlo Simulation, a Systemic Review

Abstract

The manufacturing processes involved in the fabrication of semiconductor devices are very prone to error due to its extremely intricate nature. There are several hundred processes and the process of detection of a defect is extremely capital and time consuming. In this paper, we aim to analyze the fabrication process and analyze manufacturing machine data in order to determine the average probability of excursion and the loss associated with these excursions using binary classification prediction algorithms and Monte Carlo simulations.