Analysis of Top and Bottom Contact Organic Transistor Performance for Different Technology Nodes

P. Mittal, Y. S. Negi, R. Singh
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引用次数: 2

Abstract

This research paper analyzes the performance of organic thin film transistor (OTFT) for two typical structures, viz., bottom gate top contact (BGTC) and bottom gate bottom contact (BGBC). The analysis is carried out for channel length (L) from 5 to 50 μm. A significant reduction in drain current for top contact is observed, however, it remains constant for the bottom contact device. Transconductance of the top contact device falls about 50% from 5 to 10 μm L, however, for bottom contact only 1% reduction is observed. Besides this, mobility in top contact is almost constant, whereas in bottom contact, mobility increases with larger channel lengths. Furthermore, total resistance decreases with higher gate bias, due to increase in carrier density within a channel and near contacts for both devices.
不同技术节点上触点与下触点有机晶体管性能分析
本文分析了有机薄膜晶体管(OTFT)的两种典型结构,即下栅顶触点(BGTC)和下栅底触点(BGBC)的性能。通道长度(L)在5 ~ 50 μm范围内进行了分析。观察到顶部触点的漏极电流显著降低,然而,底部触点装置的漏极电流保持不变。在5 ~ 10 μ L范围内,顶部触点器件的跨导率下降了约50%,而底部触点器件的跨导率仅下降了1%。此外,顶部接触的迁移率几乎不变,而底部接触的迁移率随着通道长度的增加而增加。此外,总电阻随着栅极偏置的增加而减小,这是由于两个器件的通道内和触点附近载流子密度的增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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