Store and Restore Delay Reduction Techniques of Non-volatile SRAM cells

Damyanti Singh, N. Pandey, K. Gupta
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Abstract

The incorporation of memristor with static random access memory (SRAM) cell, known as non-volatile SRAM (nvSRAM) cell, not only introduces non-volatile feature in it but also enhances stability and reduces power consumption. With the development in technology, this has become a mainstream development focus. During the analysis of nvSRAM cell, the store and restore delays become a major concern as the longer time duration leads to memory failure. Limited work is done to address this problem, which increases complexity during non-volatile operation. In this work, different techniques are introduced to reduce the store and restore delays. These delay reduction techniques deal with the control signals required to perform non-volatile operation. The maximum reduction of 19.41% is achieved in the store delay, while the restore delay is reduced by 21.74%. The SPICE simulations are carried out using 32nm PTM CMOS model at Vdd=1.0V.
非易失性SRAM单元的存储和恢复延迟降低技术
将忆阻器与静态随机存取存储器(SRAM)单元结合,即非易失性SRAM (nvSRAM)单元,不仅引入了非易失性特性,而且提高了稳定性,降低了功耗。随着技术的发展,这已经成为一个主流的发展焦点。在分析nvSRAM单元时,存储和恢复延迟成为一个主要问题,因为较长的时间持续时间会导致内存故障。解决这个问题的工作有限,这增加了非易失性操作的复杂性。在这项工作中,引入了不同的技术来减少存储和恢复延迟。这些延迟减少技术处理执行非易失性操作所需的控制信号。存储延迟最大减少19.41%,恢复延迟减少21.74%。采用Vdd=1.0V的32nm PTM CMOS模型进行SPICE仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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