A single-shot near edge x-ray absorption fine structure spectroscopy using double stream gas puff target source

Abstract

Thin organic samples and silicon nitride membrane were measured by means of a single-shot near edge x-ray absorption fine structure (NEXAFS) spectroscopy, using a laboratory laser produced plasma soft x-ray (SXR) source. High power nanosecond laser pulse from an Nd:YAG laser is interacting with a double stream gas puff target, forming krypton/helium plasma. Efficient emission in the "water window" spectral region and specially designed grazing incidence SXR spectrometer allow one to obtain simultaneously emission spectrum of the source and transmission spectrum of the investigated sample. Calculated absorption spectrum is then independent of source energy fluctuations and mechanical instabilities. Fine structures near the carbon K-α edge of polyethylene terephthalate (PET) film and ascorbic acid sample, as well as features near nitrogen K-α edge of silicon nitride membrane are revealed. Features near carbon absorption edges are compared with a multishot NEXAFS experiment and numerical simulations. Spectral resolution is comparable with early synchrotron measurements.