A Modified Debugging Infrastructure to Assist Real Time Fault Injection Campaigns

A. Fidalgo, G. Alves, J. Ferreira
{"title":"A Modified Debugging Infrastructure to Assist Real Time Fault Injection Campaigns","authors":"A. Fidalgo, G. Alves, J. Ferreira","doi":"10.1109/DDECS.2006.1649607","DOIUrl":null,"url":null,"abstract":"Fault injection is frequently used for the verification and validation of the fault tolerant features of microprocessors. This paper proposes the modification of a common on-chip debugging (OCD) infrastructure to add fault injection capabilities and improve performance. The proposed solution imposes a very low logic overhead and provides a flexible and efficient mechanism for the execution of fault injection campaigns, being applicable to different target system architectures","PeriodicalId":158707,"journal":{"name":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Design and Diagnostics of Electronic Circuits and systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2006.1649607","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

Fault injection is frequently used for the verification and validation of the fault tolerant features of microprocessors. This paper proposes the modification of a common on-chip debugging (OCD) infrastructure to add fault injection capabilities and improve performance. The proposed solution imposes a very low logic overhead and provides a flexible and efficient mechanism for the execution of fault injection campaigns, being applicable to different target system architectures
一个改进的调试基础设施,以协助实时故障注入活动
故障注入常用于微处理器容错特性的验证和验证。本文提出了一种改进的通用片上调试(OCD)基础结构,以增加故障注入功能并提高性能。所提出的解决方案施加了非常低的逻辑开销,并为执行故障注入活动提供了灵活有效的机制,适用于不同的目标系统体系结构
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信