Reconfigurable STT-NV LUT-based functional units to improve performance in general-purpose processors

Adarsh Reddy Ashammagari, H. Mahmoodi, T. Mohsenin, H. Homayoun
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引用次数: 5

Abstract

Unavailability of functional units is a major performance bottleneck in general-purpose processors (GPP). In a GPP with limited number of functional units while a functional unit may be heavily utilized at times, creating a performance bottleneck, the other functional units might be under-utilized. We propose a novel idea for adapting functional units in GPP architecture in order to overcome this challenge. For this purpose, a selected set of complex functional units that might be under-utilized such as multiplier and divider, are realized using a programmable look up table-based fabric. This allows for run-time adaptation of functional units to improving performance. The programmable look up tables are realized using magnetic tunnel junction (MTJ) based memories that dissipate near zero leakage and are CMOS compatible. We have applied this idea to a dual issue architecture. The results show that compared to a design with all CMOS functional units a performance improvement of 18%, on average is achieved for standard benchmarks. This comes with 4.1% power increase in integer benchmarks and 2.3% power decrease in floating point benchmarks, compared to a CMOS design.
可重构的基于STT-NV lut的功能单元,以提高通用处理器的性能
功能单元的不可用性是通用处理器(GPP)的主要性能瓶颈。在功能单元数量有限的GPP中,虽然一个功能单元有时可能被大量利用,从而造成性能瓶颈,但其他功能单元可能未得到充分利用。为了克服这一挑战,我们提出了一种适应GPP架构中功能单元的新思路。为此,选择一组可能未充分利用的复杂功能单元,如乘法器和除法器,使用基于可编程查找表的结构来实现。这允许在运行时调整功能单元以提高性能。可编程查表是使用磁隧道结(MTJ)存储器实现的,该存储器耗散接近零泄漏并且与CMOS兼容。我们已经将这个想法应用到双问题架构中。结果表明,与具有所有CMOS功能单元的设计相比,在标准基准测试中平均实现了18%的性能改进。与CMOS设计相比,整数基准测试的功耗提高了4.1%,浮点基准测试的功耗降低了2.3%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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