{"title":"Review of Burn-In for Production of Reliable Power Electronic Applications","authors":"O. Bormanis, L. Ribickis","doi":"10.1109/RTUCON48111.2019.8982357","DOIUrl":null,"url":null,"abstract":"Role of burn-in in the life cycle of power electronics assemblies is discussed in this paper. Differences between burn-in and other production screening methods are highlighted. This paper reviews burn-in testing as a part of production reliability improvement program discussing its benefits and challenges.","PeriodicalId":317349,"journal":{"name":"2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 60th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RTUCON48111.2019.8982357","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Role of burn-in in the life cycle of power electronics assemblies is discussed in this paper. Differences between burn-in and other production screening methods are highlighted. This paper reviews burn-in testing as a part of production reliability improvement program discussing its benefits and challenges.