Research on a New Optical Method for Space Charge Measurement of Insulating Materials

Hanwen Ren, Qingmin Li, Haoyu Gao, Sihong Cheng, Yunzhen Shi, Zhongdong Wang
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引用次数: 0

Abstract

To achieve the measurement of space charge inside insulating materials under high-frequency voltage conditions, an optical method based on stress birefringence effect is proposed. The method is expected to achieve high spatial and temporal resolutions due to its high signal-to-noise ratio, picosecond-scale excitation, and continuous wave detection by using Terahertz wave and ellipsometry measurement method. An ellipsometry system is then built to verify the key part of the proposed method. It is found that the measured signal from the balanced detector can accurately show the displacement process of actuator with different amplitudes and frequencies. The explorative research in this paper will be an important basis for the further development of the proposed optical method.
一种新型绝缘材料空间电荷测量光学方法的研究
为了实现高频电压条件下绝缘材料内部空间电荷的测量,提出了一种基于应力双折射效应的光学测量方法。该方法具有高信噪比、皮秒级激励、利用太赫兹波和椭偏测量方法进行连续波检测等特点,有望实现高时空分辨率。然后建立了一个椭偏系统来验证该方法的关键部分。结果表明,平衡检波器的测量信号能准确地反映执行器在不同幅值和频率下的位移过程。本文的探索性研究将为所提出的光学方法的进一步发展奠定重要的基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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