Ultra-low-power, radiation-hardened 12-bit analog-to-digital converter for space-based electro-optical sensors

S. Nystrom, T.R. Smith, W. Peterson, D. L. LeFevre, D. Butcher, L. Gipson, M.M. Spanish
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Abstract

We have achieved a breakthrough in analog-to-digital converter (ADC) technology by demonstrating a robust, self-correcting 12-bit ADC ASIC architecture with about six times lower power dissipation than existing devices. The prototype ADC has noise and average differential nonlinearities so low that we believe it has the resolution required for 14 bits. The measured ADC power dissipation is 100 mW at 6 megasamples per second (MSPS)-six times lower than that of the best commercially available radiation-hardened ADC, which has only 11 effective bits of resolution. Four sample ADCs fabricated in a commercial, non-radiation-hardened process worked perfectly at total dose levels up to 50 krad(Si), a level sufficient for many space programs. The productized ADC is expected to be extremely radiation hardened: >300 krad(Si).
超低功耗,抗辐射12位模数转换器,用于天基光电传感器
我们在模数转换器(ADC)技术方面取得了突破,展示了一种鲁棒的、自校正的12位ADC ASIC架构,其功耗比现有器件低约六倍。原型ADC的噪声和平均微分非线性非常低,我们认为它具有14位所需的分辨率。测量的ADC功耗为100mw,每秒6兆样本(MSPS),比市面上最好的抗辐射ADC低6倍,后者只有11位有效分辨率。在商业、非辐射硬化工艺中制造的四个adc样品在高达50克拉(Si)的总剂量水平下完美工作,这一水平足以满足许多太空计划。产品化的ADC预计具有极高的抗辐射强度:bb0 300 krad(Si)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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