{"title":"A Cad-Oriented Physics-Based Two-Dimensional Gaas Fet Noise Model for Mmic Design","authors":"G. Ghione, F. Bonani, M. Pirola, C. Naldi","doi":"10.1109/APMC.1992.672186","DOIUrl":null,"url":null,"abstract":"A twtrdmensional physics-based noise model for GaAs MESFET’s is described, which can provide, on the balsis of physical and geometrical input parameters o~ily, a full frequency-dependent characterization of the noise performances. The noise model is based on the classical impedance-field method, implemented within the framework of a frequency-domain numerical drift-diffusion physical model. The paper is mainly devoted to the experimental validation of the noise model, which is performed for a re& tic caw study (a 0.6 jtm GEGMarconi MESFET). Stress is laid on the role played by the high-field diffusivity model in noise analysis, which allows a good match to be achieved between measurements and simulation for both the noise figure and the op timuni source impedance.","PeriodicalId":234490,"journal":{"name":"AMPC Asia-Pacific Microwave Conference,","volume":"235 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"AMPC Asia-Pacific Microwave Conference,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.1992.672186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A twtrdmensional physics-based noise model for GaAs MESFET’s is described, which can provide, on the balsis of physical and geometrical input parameters o~ily, a full frequency-dependent characterization of the noise performances. The noise model is based on the classical impedance-field method, implemented within the framework of a frequency-domain numerical drift-diffusion physical model. The paper is mainly devoted to the experimental validation of the noise model, which is performed for a re& tic caw study (a 0.6 jtm GEGMarconi MESFET). Stress is laid on the role played by the high-field diffusivity model in noise analysis, which allows a good match to be achieved between measurements and simulation for both the noise figure and the op timuni source impedance.