A Cad-Oriented Physics-Based Two-Dimensional Gaas Fet Noise Model for Mmic Design

G. Ghione, F. Bonani, M. Pirola, C. Naldi
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引用次数: 0

Abstract

A twtrdmensional physics-based noise model for GaAs MESFET’s is described, which can provide, on the balsis of physical and geometrical input parameters o~ily, a full frequency-dependent characterization of the noise performances. The noise model is based on the classical impedance-field method, implemented within the framework of a frequency-domain numerical drift-diffusion physical model. The paper is mainly devoted to the experimental validation of the noise model, which is performed for a re& tic caw study (a 0.6 jtm GEGMarconi MESFET). Stress is laid on the role played by the high-field diffusivity model in noise analysis, which allows a good match to be achieved between measurements and simulation for both the noise figure and the op timuni source impedance.
面向cad的二维Gaas效应场效应噪声模型用于Mmic设计
描述了一种基于二维物理的GaAs MESFET噪声模型,该模型可以在物理和几何输入参数的基础上,提供与频率相关的噪声性能表征。噪声模型基于经典的阻抗场方法,在频域数值漂移扩散物理模型的框架内实现。本文主要对噪声模型进行了实验验证,并对0.6 jtm GEGMarconi MESFET进行了实验验证。强调了高场扩散率模型在噪声分析中的作用,使噪声系数和源阻抗的测量值与仿真结果很好地吻合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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