Details of the 'Ring Collapse' on Schottky Electron Emitters

M. Bronsgeest, P. Kruit
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Abstract

To gain better understanding of the shape stability of the Zr/O/W(100) Schottky electron source, the authors investigate the details of the ring collapse. The ring collapse phenomenon has been described and the shrinkage of a stack of the (100) end planes and its eventual disappearance as its W atom and the adsorbed ZrOx entities migrate away from the apex towards the shanks. The investigation of the changes of the full emission pattern in combination with SEM imaging and field simulations has revealed detailed information on shape changes taking place in the ring collapse and the origin of the associated probe current drops. They show the typical probe current profile and the typical facet current profile during a ring collapse and also a typical emission patterns characterizing each stage. In general, the duration of a ring collapse decreases with increasing temperature and decreasing extraction voltage, while the SYMMETRY increases
肖特基电子发射体“环塌缩”的细节
为了更好地理解Zr/O/W(100)肖特基电子源的形状稳定性,作者研究了环坍缩的细节。已经描述了环坍缩现象和(100)端面堆栈的收缩及其最终消失,因为它的W原子和吸附的ZrOx实体从顶点向柄迁移。结合扫描电镜成像和现场模拟,研究了全发射模式的变化,揭示了环坍塌过程中发生的形状变化和相关探针电流下降的来源的详细信息。它们显示了环坍塌过程中典型的探针电流分布图和典型的面电流分布图,以及表征每个阶段的典型发射模式。总的来说,环坍塌持续时间随着温度的升高和提取电压的降低而减小,而对称性增加
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