V. Chauhan, M. Riyad, Xinpeng Du, Changdong Wei, B. Tyburska-Püschel, Ji-Cheng Zhao, M. Khafizov
{"title":"Thermal Conductivity Degradation and Microstructural Damage Characterization in Low-Dose Ion Beam-Irradiated 3C-SiC","authors":"V. Chauhan, M. Riyad, Xinpeng Du, Changdong Wei, B. Tyburska-Püschel, Ji-Cheng Zhao, M. Khafizov","doi":"10.1007/S40553-017-0107-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":250885,"journal":{"name":"Metallurgical and Materials Transactions E","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Metallurgical and Materials Transactions E","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/S40553-017-0107-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
