Excellent fault tolerance of a MEMS optically differential reconfigurable gate array

Abstract

This paper presents a four-context MEMS optically differential reconfigurable gate array that is useful in a space radiation environment. The technique enables rapid recovery of a programmable device that has been damaged by high-energy charged particles. It can use incorrect configuration data including some error bits resulting from damage by particles. This paper also clarifies the fault tolerance of the MEMS optically differential reconfigurable gate array.