Guardbanding VLSI EEPROM test programs

Abstract

The test and guardband philosophy is essential in the manufacturing of integrated circuits. The philosophy integrates the general rules for test sequences, hardware, and software. The data sheet and philosophy determine the values and methodology for parameter and functional tests. Guardbanding is the off-setting of a test parameter, condition, or attribute acceptance level from the specified value. Variability in equipment and device performance necessitate machine guardbands. Device and test program guardbands improve test productivity. Changing the applied, measured, or external conditions from those specified implements the guardbands for attribute testing. The author addresses the use of guardbands for an MOS VLSI EEPROM, i.e. a nonvolatile reprogrammable memory.<>