Design of SRAM cell using Voltage Lowering and Stacking Techniques for Low Power Applications

J. Mishra, P. K. Misra, M. Goswami
{"title":"Design of SRAM cell using Voltage Lowering and Stacking Techniques for Low Power Applications","authors":"J. Mishra, P. K. Misra, M. Goswami","doi":"10.1109/APCCAS50809.2020.9301672","DOIUrl":null,"url":null,"abstract":"The internet of things and intelligent wearable device are bringing new challenges to IC design, where the low static power dissipation and high stability is required for portable devices. In this paper, a design of static random access memory (SRAM) cell has been proposed with high stability and low static power dissipation. In this work a voltage lowering circuit has been used to enhance the write ability while read buffer has been used for enhance the read stability of SRAM cell. Moreover the stack transistor has also been used for reducing the leakage current which results in reduction of static power dissipation. This has been noticed that there is an enhancement in the WSNM of proposed design by 11%, 22%, 35%, 13.4% as compared to 6T [4], 7T [7], 8T [8], 10T [10] SRAM cells respectively, while reduction of 0.78% as compared to 9T [9]. It has also been observed that there is a reduction of 35%, 22%, 42.9%, 61% in the static power dissipation of proposed design as compared to 6T [4], 7T [7], 9T [9] and 10T [10] SRAM cells respectively. The proposed circuit is designed using 28 nm CMOS technology node at 1 V supply voltage while the cadence virtuoso tool has been used for verification of proposed design.","PeriodicalId":127075,"journal":{"name":"2020 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","volume":"11 suppl_1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APCCAS50809.2020.9301672","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The internet of things and intelligent wearable device are bringing new challenges to IC design, where the low static power dissipation and high stability is required for portable devices. In this paper, a design of static random access memory (SRAM) cell has been proposed with high stability and low static power dissipation. In this work a voltage lowering circuit has been used to enhance the write ability while read buffer has been used for enhance the read stability of SRAM cell. Moreover the stack transistor has also been used for reducing the leakage current which results in reduction of static power dissipation. This has been noticed that there is an enhancement in the WSNM of proposed design by 11%, 22%, 35%, 13.4% as compared to 6T [4], 7T [7], 8T [8], 10T [10] SRAM cells respectively, while reduction of 0.78% as compared to 9T [9]. It has also been observed that there is a reduction of 35%, 22%, 42.9%, 61% in the static power dissipation of proposed design as compared to 6T [4], 7T [7], 9T [9] and 10T [10] SRAM cells respectively. The proposed circuit is designed using 28 nm CMOS technology node at 1 V supply voltage while the cadence virtuoso tool has been used for verification of proposed design.
基于低功耗降压和堆叠技术的SRAM单元设计
物联网和智能可穿戴设备给IC设计带来了新的挑战,便携设备要求低静态功耗和高稳定性。本文提出了一种高稳定性、低静态功耗的静态随机存取存储器(SRAM)单元设计方案。本文采用降压电路来提高SRAM单元的写入能力,同时采用读缓冲来提高SRAM单元的读稳定性。此外,堆栈晶体管还用于减少泄漏电流,从而减少静态功耗。已经注意到,与6T[4]、7T[7]、8T[8]、10T [10] SRAM单元相比,所提出设计的WSNM分别提高了11%、22%、35%、13.4%,而与9T[9]相比,WSNM降低了0.78%。还观察到,与6T[4]、7T[7]、9T[9]和10T [10] SRAM单元相比,所提出设计的静态功耗分别降低了35%、22%、42.9%和61%。该电路采用28 nm CMOS技术节点,在1 V电源电压下设计,并使用cadence virtuoso工具对所提出的设计进行验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信