Characterization of Mass-Loaded Silicon Nitride On-Chip Resonators for Traceable Sensing of Low Amplitude Acceleration

Timothy Hodges, Lixue Wu, G. Mu, N. Snell, Alexandre Bouchard, Michel Stephan, Huang Huang, T. Koukoulas, Richard Green, R. St-Gelais
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Abstract

We report on the experimental characterization of a mass-loaded silicon nitride membrane-based resonator, which we investigate towards the development of accelerometers for small amplitude acceleration sensing at low frequencies. We experimentally demonstrate a ~1.1 ×10−6 kg proof mass system achieving a 17,950 mechanical quality factor for a 526 Hz natural resonance frequency, which compares favorably to other optically interrogated on-chip accelerometers [1]–[3]. The inferred acceleration noise floor of the device is currently limited by the displacement noise of the optical fiber displacement readout, yielding a noise amplitude spectral density of $1{{\mu g/}}\sqrt {{\text{Hz}}} $ at 10 Hz.
用于低振幅加速度可追踪传感的质量负载氮化硅片上谐振器的表征
我们报告了一个质量负载氮化硅膜谐振器的实验特性,我们研究了用于低频小幅度加速度传感的加速度计的发展。我们通过实验证明了1.1 ×10 - 6 kg proof质量系统在526 Hz自然共振频率下实现了17,950的机械质量因子,这与其他光学查询片上加速度计相比更具优势[1]-[3]。该装置的推断加速度噪声底目前受到光纤位移读出的位移噪声的限制,在10 Hz时产生的噪声振幅谱密度为$1{{\mu g/}}\sqrt {{\text{Hz}}} $。
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