High Power Microstrip GaN-HEMT Switches for Microwave Applications

V. Alleva, A. Bettidi, A. Cetronio, M. Dominicis, M. Ferrari, E. Giovine, C. Lanzierf, Ernesto Limiti, A. Megna, M. Peroni, P. Romaninf
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引用次数: 27

Abstract

In this paper the design, fabrication and test of X-band and 2-18 GHz wideband high power SPDT MMIC switches in microstrip GaN technology are presented. Such switches have demonstrated state-of-the-art performances. In particular the X-band switch exhibits 1 dB insertion loss, better than 37 dB isolation and a power handling capability at 9 GHz of better than 39 dBm at 1 dB insertion loss compression point; the wideband switch has an insertion loss lower than 2.2 dB, better than 25 dB isolation and a power handling capability of better than 38 dBm in the entire bandwidth.
微波应用的高功率微带GaN-HEMT开关
本文介绍了基于微带GaN技术的x波段和2-18 GHz宽带大功率SPDT MMIC开关的设计、制造和测试。这种开关已经展示了最先进的性能。特别是,该x波段开关具有1db插入损耗、优于37db隔离以及在1db插入损耗压缩点时在9ghz时优于39dbm的功率处理能力;该宽带交换机在整个带宽内的插入损耗低于2.2 dB,隔离度优于25 dB,功率处理能力优于38 dBm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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