Corrosion effects and reliability improvement of silver wire bonded contacts in automotive application

R. Klengel, S. Klengel, J. Schischka, N. Araki, M. Eto, T. Haibara, Takashi Yamada
{"title":"Corrosion effects and reliability improvement of silver wire bonded contacts in automotive application","authors":"R. Klengel, S. Klengel, J. Schischka, N. Araki, M. Eto, T. Haibara, Takashi Yamada","doi":"10.23919/empc53418.2021.9584956","DOIUrl":null,"url":null,"abstract":"Silver (Ag) bonding wires are mainly used in consumer products as a reliable low-cost alternative to gold (Au) bonding wires. In automotive applications, the materials are exposed to particularly harsh environmental conditions. In order to understand the influence of these conditions in the electronic package on the silver-aluminum material system, we carried out extensive studies. 4N Ag wire, Pd alloyed Ag wire and a new Ag wire with innovative additives (GX2s) were encapsulated after wire bonding on Al chip metallization in a package with a chloride and sulfur-containing molding compound and subjected to corresponding reliability tests. Then, the material behavior of the different silver wires was compared to Au wire bonds after high temperature storage life test (HTSL) and unbiased highly accelerated stress test (uHAST). After broad ion beam cross sectioning the samples were investigated subsequently by Scanning Electron Microscopy (SEM). Additionally, high resolution transmission electron microscopy (TEM) investigations with nano-spot element analyses (EDS) and electron beam diffraction were done to characterize the intermetallic compounds formed and to specify the running corrosion mechanism in correlation to the alloying elements/additives used. The results show that similar degradation mechanisms take place in the Ag-Al system compared to the Au-Al system. Both material combinations show corrosion effects after testing. However, the reliability behavior of the Ag wires can be significantly optimized by adding alloying elements such as palladium or other innovative additives. Thus, the reliability behavior of electronic assemblies can be optimized even under low-cost conditions.","PeriodicalId":348887,"journal":{"name":"2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/empc53418.2021.9584956","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Silver (Ag) bonding wires are mainly used in consumer products as a reliable low-cost alternative to gold (Au) bonding wires. In automotive applications, the materials are exposed to particularly harsh environmental conditions. In order to understand the influence of these conditions in the electronic package on the silver-aluminum material system, we carried out extensive studies. 4N Ag wire, Pd alloyed Ag wire and a new Ag wire with innovative additives (GX2s) were encapsulated after wire bonding on Al chip metallization in a package with a chloride and sulfur-containing molding compound and subjected to corresponding reliability tests. Then, the material behavior of the different silver wires was compared to Au wire bonds after high temperature storage life test (HTSL) and unbiased highly accelerated stress test (uHAST). After broad ion beam cross sectioning the samples were investigated subsequently by Scanning Electron Microscopy (SEM). Additionally, high resolution transmission electron microscopy (TEM) investigations with nano-spot element analyses (EDS) and electron beam diffraction were done to characterize the intermetallic compounds formed and to specify the running corrosion mechanism in correlation to the alloying elements/additives used. The results show that similar degradation mechanisms take place in the Ag-Al system compared to the Au-Al system. Both material combinations show corrosion effects after testing. However, the reliability behavior of the Ag wires can be significantly optimized by adding alloying elements such as palladium or other innovative additives. Thus, the reliability behavior of electronic assemblies can be optimized even under low-cost conditions.
汽车用银线触点的腐蚀效应及可靠性改进
银(Ag)键合线作为金(Au)键合线的可靠低成本替代品,主要用于消费产品。在汽车应用中,材料暴露在特别恶劣的环境条件下。为了了解电子封装中这些条件对银铝材料体系的影响,我们进行了广泛的研究。将4N银丝、Pd合金银丝和添加创新添加剂(GX2s)的新型银丝在Al芯片金属化上用氯化物和含硫模塑化合物进行焊丝粘接后封装,并进行相应的可靠性试验。然后,通过高温储存寿命测试(HTSL)和无偏高加速应力测试(uHAST),比较了不同银线和金线键的材料性能。经宽离子束横切后,用扫描电子显微镜对样品进行了研究。此外,采用高分辨率透射电子显微镜(TEM)、纳米点元素分析(EDS)和电子束衍射对形成的金属间化合物进行了表征,并明确了与所使用的合金元素/添加剂相关的运行腐蚀机制。结果表明,Ag-Al体系的降解机制与Au-Al体系相似。两种材料组合均表现出腐蚀效应。然而,通过添加合金元素,如钯或其他创新添加剂,可以显著优化银丝的可靠性行为。因此,即使在低成本条件下,电子组件的可靠性行为也可以得到优化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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