Fast Array Diagnosis Based on Measured Complex Array Signals with Short Measurement Distance

Mengting Li, Fengchun Zhang, W. Fan
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Abstract

Fast array diagnosis method is of great importance for ensuring reliable array performances in the fifth generation (5G) communication systems. In this paper, a fast array diagnosis method is presented for antenna arrays composed of several subarrays. The objective is to detect the failures based on the measured complex array signals in short measurement distance. A single probe is required to record the array response in the near-field of the array. All the array elements are excited simultaneously, and only phase shift states of 0° and 180° are required in the measurements. For a base station (BS) antenna array with $N$ subarrays, $N+1$ measurements are required, resulting in a fast diagnosis process. Finally, the proposed method was validated in an antenna array composed of 4 subarrays with 3 antenna elements in each subarray and successful diagnosis results (for both the whole subarray and single antenna element failure cases) can be observed.
基于短测量距离复杂阵列信号的快速阵列诊断
在第五代(5G)通信系统中,快速阵列诊断方法对于保证阵列的可靠性能具有重要意义。针对由多个子阵组成的天线阵,提出了一种快速的阵列诊断方法。目的是在较短的测量距离内,根据测量到的复杂阵列信号进行故障检测。记录阵列近场的阵列响应需要一个单探头。所有阵列元件同时被激发,在测量中只需要0°和180°的相移状态。对于具有$N$子阵的基站(BS)天线阵列,需要进行$N+1$测量,从而实现快速诊断过程。最后,在4个子阵(每个子阵中有3个天线单元)组成的天线阵中对该方法进行了验证,得到了成功的诊断结果(包括整个子阵和单个天线单元故障情况)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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