{"title":"Investigation on High Power Durability of Standard LC Connectors for DWDM Application.","authors":"Rakibul Islam Shabbir, Lin Ma, Zuyuan He","doi":"10.1109/OECC48412.2020.9273569","DOIUrl":null,"url":null,"abstract":"We investigated high power durability of standard LC connectors both with and without consideration of dust at about 18 W. Our results imply that monitoring output power variation is effective to protect connectors from damage.","PeriodicalId":433309,"journal":{"name":"2020 Opto-Electronics and Communications Conference (OECC)","volume":"292 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Opto-Electronics and Communications Conference (OECC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OECC48412.2020.9273569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We investigated high power durability of standard LC connectors both with and without consideration of dust at about 18 W. Our results imply that monitoring output power variation is effective to protect connectors from damage.