Ray tracing of Steiner patches

T. Sederberg, David C. Anderson
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引用次数: 47

Abstract

Steiner patches are triangular surface patches for which the Cartesian coordinates of points on the patch are defined parametrically by quadratic polynomial functions of two variables. It has recently been shown that it is possible to express a Steiner patch in an implicit equation which is a degree four polynomial in x,y,z. Furthermore, the parameters of a point known to be on the surface can be computed as rational polynomial functions of x,y,z. These findings lead to a straightforward algorithm for ray tracing Steiner patches in which the ray intersection equation is a degree four polynomial in the parameter of the ray. The algorithm presented represents a major simplification over existing techniques for ray tracing free-form surface patches.
斯坦纳补丁的光线追踪
Steiner patch是一种三角形的曲面patch,其上点的笛卡尔坐标由两个变量的二次多项式函数参数化定义。最近的研究表明,在x,y,z的四次多项式的隐式方程中可以表示Steiner patch。此外,已知在曲面上的点的参数可以用x,y,z的有理多项式函数来计算。这些发现导致了射线追踪斯坦纳补丁的直接算法,其中射线相交方程是射线参数的四次多项式。所提出的算法对现有的射线追踪自由曲面补丁技术进行了重大的简化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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