Test pattern embedding in sequential circuits through cellular automata

Abstract

The embedding of test patterns into a sequential circuit is the main topic of this paper. Deterministic test patterns for the sequential circuit under test are chosen to be embedded into hybrid cellular automata (CA). Test identification and CA synthesis are performed in parallel thus overcoming results achieved by embedding pre-computed vectors. The theory of sequential test generation under such a constraint is provided and the feasibility of the proposed testing methodology is shown on benchmarks.