Accurate off-line phase classification for HW/SW co-designed processors

Aleksandar Brankovic, Kyriakos Stavrou, E. Gibert, Antonio González
{"title":"Accurate off-line phase classification for HW/SW co-designed processors","authors":"Aleksandar Brankovic, Kyriakos Stavrou, E. Gibert, Antonio González","doi":"10.1145/2597917.2597937","DOIUrl":null,"url":null,"abstract":"Evaluation techniques in microprocessor design are mostly based on simulating selected application's samples using a cycle-accurate simulator. These samples usually correspond to different phases of the application stream. To identify these phases, relevant high-level application statistics are collected and clustered using a process named \"Off-Line Phase Classification\". The purpose of phase classification is to reduce the number of samples that need to be simulated with the minimum loss in accuracy (compared to simulating the complete set of samples). Unfortunately, when directly applied to HW/SW co-designed processors the traditional phase classifications do not provide a good trade-off between accuracy and the number of samples. As an example, according to our experimental results, to achieve a 4% error (compared to simulating all the samples) one needs to simulate 2.5X more samples for the case of HW/SW co-designed processors compared to what is necessary for HW-only processors. In this paper, we propose a novel off-line phase classification scheme called TOL Description Vector (TDV), which is suitable for HW/SW co-designed processors. TDV targets at estimating the TOL particularities and on average gives significantly better accuracy than traditional phase classification for any number of selected samples. For instance, TDV reaches the average error of 3% with 3X less samples than traditional classification. These benefits apply for different TOL and microarchitecture configurations.","PeriodicalId":194910,"journal":{"name":"Proceedings of the 11th ACM Conference on Computing Frontiers","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th ACM Conference on Computing Frontiers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2597917.2597937","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Evaluation techniques in microprocessor design are mostly based on simulating selected application's samples using a cycle-accurate simulator. These samples usually correspond to different phases of the application stream. To identify these phases, relevant high-level application statistics are collected and clustered using a process named "Off-Line Phase Classification". The purpose of phase classification is to reduce the number of samples that need to be simulated with the minimum loss in accuracy (compared to simulating the complete set of samples). Unfortunately, when directly applied to HW/SW co-designed processors the traditional phase classifications do not provide a good trade-off between accuracy and the number of samples. As an example, according to our experimental results, to achieve a 4% error (compared to simulating all the samples) one needs to simulate 2.5X more samples for the case of HW/SW co-designed processors compared to what is necessary for HW-only processors. In this paper, we propose a novel off-line phase classification scheme called TOL Description Vector (TDV), which is suitable for HW/SW co-designed processors. TDV targets at estimating the TOL particularities and on average gives significantly better accuracy than traditional phase classification for any number of selected samples. For instance, TDV reaches the average error of 3% with 3X less samples than traditional classification. These benefits apply for different TOL and microarchitecture configurations.
硬件/软件协同设计处理器的准确离线相位分类
微处理器设计中的评估技术大多基于使用周期精确模拟器模拟选定的应用程序样本。这些示例通常对应于应用程序流的不同阶段。为了识别这些阶段,使用名为“离线阶段分类”的过程收集和聚集相关的高级应用程序统计信息。相位分类的目的是在精度损失最小的情况下减少需要模拟的样本数量(与模拟完整的样本集相比)。不幸的是,当直接应用于硬件/软件共同设计的处理器时,传统的相位分类不能在精度和样本数量之间提供良好的权衡。例如,根据我们的实验结果,要实现4%的误差(与模拟所有样本相比),与仅HW处理器所需的样本相比,在HW/SW共同设计处理器的情况下,需要模拟2.5倍以上的样本。在本文中,我们提出了一种新的离线相位分类方案,称为TOL描述向量(TDV),它适用于软硬件协同设计的处理器。TDV的目标是估计TOL的特殊性,平均而言,对于任何数量的选定样本,它都比传统的相位分类具有更好的准确性。例如,TDV在比传统分类少3倍的样本情况下,平均误差达到3%。这些优点适用于不同的TOL和微架构配置。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信