Design Exploration of Dynamic Multi-Level Ternary Content-Addressable Memory Using Nanoelectromechanical Relays

Taixin Li, Hongtao Zhong, Sumitha George, N. Vijaykrishnan, Liang Shi, Huazhong Yang, Xueqing Li
{"title":"Design Exploration of Dynamic Multi-Level Ternary Content-Addressable Memory Using Nanoelectromechanical Relays","authors":"Taixin Li, Hongtao Zhong, Sumitha George, N. Vijaykrishnan, Liang Shi, Huazhong Yang, Xueqing Li","doi":"10.1109/ISVLSI59464.2023.10238633","DOIUrl":null,"url":null,"abstract":"Multi-Level Ternary Content Addressable Memories (ML-TCAMs) are a type of TCAM that can calculate the hamming distance between the stored data and the input vector, which can be used to accelerate several specific applications. There have been several existing current-domain and charge-domain ML-TCAMs based on SRAMs and nonvolatile memories (NVMs). However, they fail to meet a good balance between area and computational accuracy tradeoffs.In this paper, for the first time, we explore the design of dynamic ML-TCAMs that achieve both high cell density and high accuracy, and propose DyLAN, the current-domain dynamic ML-TCAM using the 4-terminal nanoelectromechanical (NEM) relays. Specifically, combined with the nearly zero OFF-state leakage and stable ON-state current of the 4-terminal NEM relays, this paper proposes DyLAN-W with ultra-long retention time and DyLAN-S with ultra-low single refresh overhead and high density, respectively. Results show that DyLAN achieves up to 2.7 x and 4.9x area reduction compared with the 16T SRAM ML-TCAM and the charge-domain ML-TCAMs, respectively, and increases the few-shot learning accuracy by 13.7% (from 79.9% to 93.6%) on average compared with the state-of-the-art nonvolatile ML-TCAM, i.e., the 2FeFET ML-TCAM.","PeriodicalId":199371,"journal":{"name":"2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVLSI59464.2023.10238633","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Multi-Level Ternary Content Addressable Memories (ML-TCAMs) are a type of TCAM that can calculate the hamming distance between the stored data and the input vector, which can be used to accelerate several specific applications. There have been several existing current-domain and charge-domain ML-TCAMs based on SRAMs and nonvolatile memories (NVMs). However, they fail to meet a good balance between area and computational accuracy tradeoffs.In this paper, for the first time, we explore the design of dynamic ML-TCAMs that achieve both high cell density and high accuracy, and propose DyLAN, the current-domain dynamic ML-TCAM using the 4-terminal nanoelectromechanical (NEM) relays. Specifically, combined with the nearly zero OFF-state leakage and stable ON-state current of the 4-terminal NEM relays, this paper proposes DyLAN-W with ultra-long retention time and DyLAN-S with ultra-low single refresh overhead and high density, respectively. Results show that DyLAN achieves up to 2.7 x and 4.9x area reduction compared with the 16T SRAM ML-TCAM and the charge-domain ML-TCAMs, respectively, and increases the few-shot learning accuracy by 13.7% (from 79.9% to 93.6%) on average compared with the state-of-the-art nonvolatile ML-TCAM, i.e., the 2FeFET ML-TCAM.
基于纳米机电继电器的动态多级三元内容可寻址存储器设计探索
多级三元内容可寻址存储器(ML-TCAMs)是一种可以计算存储数据与输入向量之间的汉明距离的TCAM,它可以用来加速一些特定的应用。目前已有几种基于sram和非易失性存储器(nvm)的电流域和电荷域ml - tcam。然而,它们不能很好地平衡面积和计算精度之间的权衡。在本文中,我们首次探索了同时实现高单元密度和高精度的动态ML-TCAM的设计,并提出了DyLAN,一种采用4端纳米机电(NEM)继电器的电流域动态ML-TCAM。具体而言,结合4端NEM继电器近乎零的off状态泄漏和稳定的on状态电流,本文分别提出了超长保持时间的DyLAN-W和超低单次刷新开销的DyLAN-S和高密度的DyLAN-S。结果表明,与16T SRAM ML-TCAM和电荷域ML-TCAM相比,DyLAN的面积分别减少了2.7倍和4.9倍,并且与最先进的非易失性ML-TCAM(即2FeFET ML-TCAM)相比,少射学习精度平均提高了13.7%(从79.9%提高到93.6%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信