Generalized method of auxiliary sources (integrated auxiliary sources)

Abstract

The modification of the method of auxiliary sources (MAS) for solving the electromagnetic (EM) diffraction problems is discussed. The presented approach explores the integrated auxiliary sources reducing in may cases the number of unknowns of a particular problem. This is especially important for scattering problems on open structures, scatterers with thin geometry, dielectric scatterers with very high permittivity. The results of particular problems solution are presented to demonstrate the capabilities of the method (e.g. diffraction on thin dielectric parallelepiped and scattering by perfectly conducting cube with one open side).