Power-aware multi-voltage custom memory models for enhancing RTL and low power verification

V. K. Kalyanam, M. Saint-Laurent, J. Abraham
{"title":"Power-aware multi-voltage custom memory models for enhancing RTL and low power verification","authors":"V. K. Kalyanam, M. Saint-Laurent, J. Abraham","doi":"10.1109/ICCD.2015.7357080","DOIUrl":null,"url":null,"abstract":"We describe a methodology to model the low power and voltage behavior of multi-voltage custom memories in processors. These models facilitate early power-aware verification by abstracting the transistor-level representation of the memory to its power-aware behavioral RTL model. To the best of our knowledge, this is the first attempt at addressing the power-aware RTL model generation problem for custom memories. In our method, we identify voltage crossing points in transistors across channel connected components and use these crossing points to transform the RTL for power-awareness closely matching its circuit implementation. Without the proposed abstraction technique to generate power-aware RTL, low-power verification of such memories will need to be done using transistor-level simulations that are prohibitively time-intensive and hence impractical. We check for correctness of these generated power-aware memory models through formal equivalence, symbolic simulations, assertion and simulation based verification. These models are also validated using static power-domain checks. By applying this methodology in a power-aware design and verification framework on a commercial processor, we identified and corrected low power circuit and RTL bugs prior to tape-out.","PeriodicalId":129506,"journal":{"name":"2015 33rd IEEE International Conference on Computer Design (ICCD)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 33rd IEEE International Conference on Computer Design (ICCD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2015.7357080","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We describe a methodology to model the low power and voltage behavior of multi-voltage custom memories in processors. These models facilitate early power-aware verification by abstracting the transistor-level representation of the memory to its power-aware behavioral RTL model. To the best of our knowledge, this is the first attempt at addressing the power-aware RTL model generation problem for custom memories. In our method, we identify voltage crossing points in transistors across channel connected components and use these crossing points to transform the RTL for power-awareness closely matching its circuit implementation. Without the proposed abstraction technique to generate power-aware RTL, low-power verification of such memories will need to be done using transistor-level simulations that are prohibitively time-intensive and hence impractical. We check for correctness of these generated power-aware memory models through formal equivalence, symbolic simulations, assertion and simulation based verification. These models are also validated using static power-domain checks. By applying this methodology in a power-aware design and verification framework on a commercial processor, we identified and corrected low power circuit and RTL bugs prior to tape-out.
用于增强RTL和低功耗验证的功率感知多电压自定义存储器模型
我们描述了一种方法来模拟处理器中多电压自定义存储器的低功耗和电压行为。这些模型通过将内存的晶体管级表示抽象为其功耗感知行为RTL模型,从而促进了早期的功耗感知验证。据我们所知,这是解决自定义内存的功耗感知RTL模型生成问题的第一次尝试。在我们的方法中,我们识别跨通道连接组件的晶体管中的电压交叉点,并使用这些交叉点来转换RTL,使其与电路实现紧密匹配。如果没有提出的抽象技术来生成功率感知的RTL,那么这种存储器的低功耗验证将需要使用晶体管级模拟来完成,这是非常耗时的,因此不切实际。我们通过形式等价、符号模拟、断言和基于仿真的验证来检查这些生成的功率感知内存模型的正确性。这些模型还使用静态功率域检查进行验证。通过在商用处理器上的功耗感知设计和验证框架中应用此方法,我们在带出之前识别并纠正了低功耗电路和RTL错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信