Site dependencies in a multisite testing environment

Abstract

This paper describes a statistical approach for online yield analysis for multisite testing of highly reliable automotive ICs as well as the implementation of the system for testing mostly analog circuits. The core of the approach is the yield analysis of the different sites based on statistical measures. The system has been implemented as part of the production environment of Elmos Semiconductor. It is in daily use. Although the analysis tool has been accepted reluctantly, it soon became an excellent tool with a significant impact on test quality and cost saving.