The Reliability of Optical Logic

C. Stirk, D. Psaltis
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引用次数: 3

Abstract

One of the potential niches for optical logic is very high speed digital circuits. Conventional lithographic manufacturing techniques decrease the individual logic device cost when the device density per unit area increases. Thermal power dissipation limitations, however, restrict the device density at a given duty cycle and switching speed. Thus, we desire optical logic devices with small switching energies for high speed systems. Since switching energy usually decreases with decreasing device area, small devices decrease thermal dissipation problems and increase manufacturing density.
光逻辑的可靠性
高速数字电路是光逻辑的潜在应用领域之一。传统的光刻制造技术在单位面积器件密度增加的情况下降低了单个逻辑器件的成本。然而,在给定的占空比和开关速度下,热功耗限制限制了器件密度。因此,我们希望具有小开关能量的光学逻辑器件用于高速系统。由于开关能量通常随着器件面积的减小而减小,小器件减少了散热问题并增加了制造密度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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