INVESTIGATION OF THE POSSIBILITIES OF USING VARIOUS INDUSTRIAL EXTRACTORS TO DETERMINE THE SPICE MODEL PARAMETERS OF SUBMICRON MOSFETS IN THE TEMPERATURE RANGE UP TO +300°C

Abstract

The possibilities of determining the SPICE model parameters in an extended temperature range were investigated using the three most common commercial extractors IC-CAP, MBP and BSIMProPlus. Comparative estimates of the efficiency of extractors are given on the example of calculating MOSFETs I–V characteristic taking into account the temperatures up to +300°C.