Reliability Stripe Coagulation in Two Failure Tolerant Storage Arrays

Thomas Schwarz, J. R. Santiago
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Abstract

As the industry slowly transitions to data centers made up of electronic instead of magnetic storage components, the rate of device failure and page corruption will decrease, but not vanish. In this emerging environment, redundant storage is still required to safeguard data. We argue that the use of two failure resilient linear codes with an exclusive-or (xor) based P-parity and a Q-parity calculated using a finite field operations is appropriate. We use the algebraic property of finite fields to show how to coagulate a number of small constituent’’ reliability stripes into larger coagulated stripes without recalculating parities. This allows to protect largely inactive data with more storage efficient larger reliability stripes. The procedure is reversible.
双容错存储阵列的可靠性分条凝聚
随着行业慢慢过渡到由电子而不是磁性存储组件组成的数据中心,设备故障率和页面损坏率将会下降,但不会消失。在这种新兴环境中,仍然需要冗余存储来保护数据。我们认为使用两个基于异或(xor)的p -宇称和使用有限域运算计算的q -宇称的失效弹性线性码是合适的。我们利用有限域的代数性质,说明了如何在不重新计算奇偶的情况下,将若干小的组成“可靠度条”凝聚成较大的凝聚条。这允许使用更高的存储效率和更大的可靠性条带来保护大部分非活动数据。这个过程是可逆的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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