J. Petillo, K. Eppley, D. Panagos, E. Nelson, N. Dionne, J. Deford, B. Held, L. Chernyakova, J. Burdette, X. Zhai, M. Cattelino, K. Nguyen, B. Levush
{"title":"Application of the 2D/3D MICHELLE code to electron gun and collector modeling","authors":"J. Petillo, K. Eppley, D. Panagos, E. Nelson, N. Dionne, J. Deford, B. Held, L. Chernyakova, J. Burdette, X. Zhai, M. Cattelino, K. Nguyen, B. Levush","doi":"10.1109/IVEC.2003.1285997","DOIUrl":null,"url":null,"abstract":"The focus of the development program is to combine modern finite element techniques with improved physics models. The code employs a conformal mesh, including both structured and unstructured mesh architectures for meshing flexibility, along with a new method for accurate, efficient particle tracking. New particle emission models for thermionic beam representation are included that support primary emission, and secondary emission is handled with an advanced model.","PeriodicalId":203178,"journal":{"name":"4th IEEE International Conference on Vacuum Electronics, 2003","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"4th IEEE International Conference on Vacuum Electronics, 2003","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2003.1285997","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The focus of the development program is to combine modern finite element techniques with improved physics models. The code employs a conformal mesh, including both structured and unstructured mesh architectures for meshing flexibility, along with a new method for accurate, efficient particle tracking. New particle emission models for thermionic beam representation are included that support primary emission, and secondary emission is handled with an advanced model.