Leveraging Transverse Reads to Correct Alignment Faults in Domain Wall Memories

S. Ollivier, Donald Kline, Kawsher A. Roxy, R. Melhem, S. Bhanja, A. Jones
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引用次数: 16

Abstract

Spintronic domain wall memories (DWMs) are prone to alignment faults, which cannot be protected by traditional error correction techniques. To solve this problem, we propose a new technique called derived error correction coding (DECC). We construct metadata from the data and shift state of the DWM, on demand, using a novel transverse read (TR). TR reads in an orthogonal direction to the DWM access point and can determine the number of ones in a DWM. Errors in the metadata correspond to shift-faults in the DWM. Rather than storing the metadata, it is created on-demand and protected by storing parity bits. Repairing the metadata with ECC allows restoration of DWM alignment and ensures correct operation. Through these techniques, our shift-aware error correction approaches provide a lifetime of over 15 years with a similar performance, while reducing area and energy by 370% and 52%, versus the state-of-the-art, for a 32-bit nanowire.
利用横向读取来纠正域壁存储器中的对齐错误
自旋电子畴壁存储器(DWMs)容易出现对准错误,传统的纠错技术无法保护这些错误。为了解决这个问题,我们提出了一种新的技术,称为派生纠错编码(DECC)。根据需要,我们使用新颖的横向读取(TR)从DWM的数据和移位状态构建元数据。TR以正交方向读取到DWM接入点,并且可以确定DWM中接入点的数量。元数据中的错误对应于DWM中的移位错误。它不是存储元数据,而是按需创建,并通过存储奇偶校验位进行保护。使用ECC修复元数据可以恢复DWM对齐并确保正确操作。通过这些技术,我们的位移感知纠错方法提供了超过15年的使用寿命,具有类似的性能,同时与最先进的32位纳米线相比,面积和能量分别减少了370%和52%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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