{"title":"Test Selection, Trace Distance and Heuristics","authors":"L. Feijs, N. Goga, S. Mauw, J. Tretmans","doi":"10.1007/978-0-387-35497-2_20","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":433439,"journal":{"name":"International Conference on Testing (of Software and) Communication Systems","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"45","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Testing (of Software and) Communication Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-0-387-35497-2_20","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}