Reliability: A New Approach in Design of Inverters for PV Systems

2006 IEEE International Power Electronics Congress Pub Date : 2006-10-01 DOI:10.1109/CIEP.2006.312159

F. Chan, H. Calleja

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引用次数: 36

Abstract

Several surveys of single-phase inverters for residential installations have been reported recently. However, the surveys are aimed at establishing a classification of the topologies reported, and do not explicitly take into account the reliability. This paper presents a reliability-oriented survey of the inverter topologies reported in the literature. The survey is aimed at finding out how well the designers have solved the reliability issue. As such, it complements previous surveys focused at issues such as maturity of the technology. Also a reliability prediction of four photovoltaic systems is presented: a two-stages system, a three-stages one, and two integrated topologies, one with a boost-inverter, and the second with a buck-boost inverter. The goal is to identify the most failure prone components, and the stress factors with the highest contribution to the failure rate. In all cases, it was found that the transistors are the most vulnerable components, and that the dominant stress factor is related to the temperature. It was also found that the reliability can be improved if the switching devices are overrated, but only to a certain level, and using too large transistors can be counterproductive

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可靠性:光伏系统逆变器设计的新途径

最近对住宅装置的单相逆变器进行了几项调查。然而，调查的目的是建立一个分类的拓扑报告，并没有明确考虑到可靠性。本文对文献中报道的逆变器拓扑进行了以可靠性为导向的调查。这项调查的目的是找出设计者解决可靠性问题的程度。因此，它补充了先前关注技术成熟度等问题的调查。同时给出了四种光伏系统的可靠性预测:两级系统、三级系统和两种集成拓扑，一种是升压逆变器，另一种是降压逆变器。目标是确定最容易发生故障的部件，以及对故障率贡献最大的应力因素。在所有情况下，我们都发现晶体管是最脆弱的元件，而主要的应力因素与温度有关。研究还发现，如果开关器件被高估，可靠性可以得到提高，但只能达到一定的水平，而使用过大的晶体管可能适得其反

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2006 IEEE International Power Electronics Congress

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