Diagnosis of the failing component in RF receivers through adaptive full-path measurements

E. Acar, S. Ozev
{"title":"Diagnosis of the failing component in RF receivers through adaptive full-path measurements","authors":"E. Acar, S. Ozev","doi":"10.1109/VTS.2005.42","DOIUrl":null,"url":null,"abstract":"Decreasing profit margins and time-to-market windows for radiofrequency transceivers, rule out the traditional component-based testing and diagnosis methods. Over the past few years, there has been a significant shift in the transceiver test methods towards full-path and loop-back testing. However, the benefits of path-based testing cannot be fully attained unless complimentary diagnosis methods can be developed. In this paper, we present an adaptive diagnosis methodology to identify the failing component in RF receivers. Once the fault type (hard fault or soft fault) is identified using eigensignature correlations, input signals are selected and ambiguity groups determined. A new input signal is applied based on the ambiguity groups until full diagnostic resolution is reached or test inputs are exhausted. While it is typically believed that partitioned parameters, such as the gain of an individual component, cannot be fully diagnosed, the inherently non-linear behavior of analog blocks results in distinguishable response patterns even for scalar parameters. Experimental results confirm that diagnosis using only path-based measurements is viable.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.42","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

Abstract

Decreasing profit margins and time-to-market windows for radiofrequency transceivers, rule out the traditional component-based testing and diagnosis methods. Over the past few years, there has been a significant shift in the transceiver test methods towards full-path and loop-back testing. However, the benefits of path-based testing cannot be fully attained unless complimentary diagnosis methods can be developed. In this paper, we present an adaptive diagnosis methodology to identify the failing component in RF receivers. Once the fault type (hard fault or soft fault) is identified using eigensignature correlations, input signals are selected and ambiguity groups determined. A new input signal is applied based on the ambiguity groups until full diagnostic resolution is reached or test inputs are exhausted. While it is typically believed that partitioned parameters, such as the gain of an individual component, cannot be fully diagnosed, the inherently non-linear behavior of analog blocks results in distinguishable response patterns even for scalar parameters. Experimental results confirm that diagnosis using only path-based measurements is viable.
基于自适应全径测量的射频接收机故障诊断
由于射频收发器的利润率和上市时间窗口不断减少,传统的基于组件的测试和诊断方法被排除在外。在过去的几年中,收发器测试方法有了重大的转变,朝着全径和环回测试方向发展。然而,除非能够开发出相应的诊断方法,否则基于路径的检测的好处不能完全实现。在本文中,我们提出了一种自适应诊断方法来识别射频接收机中的故障组件。一旦使用特征特征相关性识别故障类型(硬故障或软故障),就可以选择输入信号并确定歧义组。根据歧义组应用新的输入信号,直到达到完全诊断分辨率或耗尽测试输入。虽然通常认为分割参数(如单个组件的增益)不能完全诊断,但模拟块固有的非线性行为导致即使对于标量参数也可以区分响应模式。实验结果证实,仅使用基于路径的测量进行诊断是可行的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信