Fault-Masking Capabilities of Basic Circuit Structures

Bernhard Fechner
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Abstract

In this work, we present a theoretical model, which allows computing the effective fault rate of basic, regular circuit structures by paper and pencil. It therefore is possible to compute the masking capabilities of a circuit in the modeling phase - before the circuit is implemented. It furthermore allows calculating how much a fault can propagate within a circuit, may it be transient or permanent. The result is the maximal vulnerability of a circuit on gate-level. As an example, we take addition, since it is an essential operation in nearly every computing system. Over the years, many different methods with different minimum constraints concerning area and time have been developed. Parallel prefix adders are very regular in their structure, so that their vulnerability can be easily computed. The result of the exemplary examination is a ranking concerning the masking capabilities of such adders.
基本电路结构的故障屏蔽能力
在这项工作中,我们提出了一个理论模型,可以用纸和铅笔计算基本规则电路结构的有效故障率。因此,在电路实现之前,可以在建模阶段计算电路的屏蔽能力。它还允许计算故障在电路中传播的程度,可能是短暂的,也可能是永久的。其结果是电路在门级上的最大脆弱性。作为一个例子,我们以加法为例,因为它是几乎每个计算系统中必不可少的操作。多年来,人们开发了许多不同的方法,对面积和时间有不同的最小约束。并行前缀加法器的结构非常规则,因此可以很容易地计算出其脆弱性。示例性检查的结果是关于这些加法器的屏蔽能力的排序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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