Multi-Resolution-Based Contour Corner Extraction Algorithm for Computer Vision-Based Measurement

Abstract

Corner-based registration of the industry standard contour and the actual product contour is one of the key steps in industrial computer vision-based measurement. However, existing corner extraction algorithms do not achieve satisfactory results in the extraction of the standard contour and the deformed contour of the actual product. This paper proposes a multi-resolution-based contour corner extraction algorithm for computer vision-based measurement. The algorithm first obtains different corners in multiple resolutions, then sums up the weighted corner values, and finally chooses the corner points with the appropriate corner values as the final contour corners. The experimental results show that the proposed algorithm, based on multi-resolution, outperforms the original algorithm in the aspect of the corner matching situation and helps in subsequent product measurements.