A skin effect correction method for hostile array compensated true resistivity tool (HCRT)

Abstract

Hostile Array Compensated True Resistivity Tool (HCRT) has the characteristics of high resolution, complex intrusion interpretation and stratigraphic analysis, which can be effectively used in reservoir evaluation of ultra-deep wells. Skin effect is one of the important sources of measurement error in induction logging. Therefore, skin effect correction is needed in the process of logging signal analysis and processing. According to the tricyclic system theory and electromagnetic field theory, a new skin effect correction method that can be applied to HCRT is proposed. The corresponding database is constructed by using the combination of three frequency correction and normalization correction. The true conductivity of non-uniform formation is calculated by linear interpolation. The correction results show that the corrected formation response is more linear and the apparent conductivity is closer to the true conductivity.