Improving calibration of array antennas via Microwave Imaging

T. Dallmann, Dirk Czepluch, D. Heberling
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引用次数: 1

Abstract

Complex array signal processing algorithms like Multiple Signal Classification often require a precise knowledge of the radiation characteristics of the array antenna in use. Calibration of group antennas by determination of antenna array radiation patterns is therefore a fundamental task for improving the performance of these algorithms. From a practical point of view this requirement is challenging, since the environment surrounding the antenna may alter over time or may even be completely unknown. This environment can have a severe influence on the group antenna radiation patterns. The approach proposed in this paper uses a Microwave Imaging technique to reconstruct position and shape of scatterers surrounding the array antenna. This information can further be used to calculate the field scattered by these objects as well as the total radiation pattern of group antenna and environment. The proposed algorithm only requires S-parameters of the antenna array measured in presence of the scatterers. The theoretical concept of this method is presented in this paper. Results obtained by numerical simulation show that this algorithm provides better radiation pattern estimates than other commonly known calibration methods.
利用微波成像技术改进阵列天线的校准
复杂的阵列信号处理算法,如多信号分类,通常需要对使用中的阵列天线的辐射特性有精确的了解。因此,通过确定天线阵列辐射方向图来校准群天线是提高这些算法性能的一项基本任务。从实际的角度来看,这一要求是具有挑战性的,因为天线周围的环境可能会随着时间的推移而改变,甚至可能完全未知。这种环境会对群天线的辐射方向图产生严重影响。本文提出的方法是利用微波成像技术重建阵列天线周围散射体的位置和形状。这些信息可以进一步用于计算这些目标的散射场以及群天线和环境的总辐射方向图。该算法只需要在散射体存在的情况下测量天线阵列的s参数。本文提出了该方法的理论概念。数值模拟结果表明,该算法比其他常用的校正方法提供了更好的辐射方向图估计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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