{"title":"Fabrication of depletion- and enhancement-mode GaInP/GaAs /spl delta/-HEMT's","authors":"Min-Yuan Wu, W. Lour, Ge Huang, Y. Shih","doi":"10.1109/COMMAD.1998.791624","DOIUrl":null,"url":null,"abstract":"A new HEMT structure was proposed to fabricate both types .f device. Additional n-GaAs cap layer was employed to control the device operation mode. Accordingly, both depletion- and enhancement- mode HEMT's were simultaneously fabricated on the same chip by selectivelv removing the cap layer. For a 1x100 pm2 device, the pinch-c$f voltage for the depletion mode device is -1.8 K The maximum applied gate voltage for the enhancement mode one is +I.8 K The measured output current and transconductance are 260 (200) mA/mm, 175 (150) mS/mm. The measured f t und f ma are 6.3 (6) and 13 (12) GHz for depletion- and enhancement-mode devices, respectively.","PeriodicalId":300064,"journal":{"name":"1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.1998.791624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A new HEMT structure was proposed to fabricate both types .f device. Additional n-GaAs cap layer was employed to control the device operation mode. Accordingly, both depletion- and enhancement- mode HEMT's were simultaneously fabricated on the same chip by selectivelv removing the cap layer. For a 1x100 pm2 device, the pinch-c$f voltage for the depletion mode device is -1.8 K The maximum applied gate voltage for the enhancement mode one is +I.8 K The measured output current and transconductance are 260 (200) mA/mm, 175 (150) mS/mm. The measured f t und f ma are 6.3 (6) and 13 (12) GHz for depletion- and enhancement-mode devices, respectively.