{"title":"An intelligent defect inspection technique for color filter","authors":"C. Chang, H. Chang, Chia-Pin Hsu","doi":"10.1109/ICMECH.2005.1529388","DOIUrl":null,"url":null,"abstract":"Automatic defect inspection systems are becoming more and more important in industrial production lines. Especially in electronics industry, an attempt is often made to achieve almost 100% quality control of all components and final goods. Here we are interested in the defect inspection of color filter, which is one of components in TFT-LCD module and gives each pixel of LCD its own color. The difficulties in the defect inspection of color filter are its complex texture and demand for high-speed processing. In this paper, we propose a neural-fuzzy-inference-network (NFIN)-based defect inspection algorithm to detect the materials with regular pattern such as color filter. The NFIN, which is basically a fuzzy inference system and its fuzzy rules and corresponding parameters can be learned by neural network automatically, is a good alternative to achieve the defect inspection. Experimental results show that the proposed algorithm is a promising method to detect the defects of color filter. The proposed algorithm can apply to not only the detection of color filter but also the detection of web materials.","PeriodicalId":175701,"journal":{"name":"IEEE International Conference on Mechatronics, 2005. ICM '05.","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Conference on Mechatronics, 2005. ICM '05.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMECH.2005.1529388","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15
Abstract
Automatic defect inspection systems are becoming more and more important in industrial production lines. Especially in electronics industry, an attempt is often made to achieve almost 100% quality control of all components and final goods. Here we are interested in the defect inspection of color filter, which is one of components in TFT-LCD module and gives each pixel of LCD its own color. The difficulties in the defect inspection of color filter are its complex texture and demand for high-speed processing. In this paper, we propose a neural-fuzzy-inference-network (NFIN)-based defect inspection algorithm to detect the materials with regular pattern such as color filter. The NFIN, which is basically a fuzzy inference system and its fuzzy rules and corresponding parameters can be learned by neural network automatically, is a good alternative to achieve the defect inspection. Experimental results show that the proposed algorithm is a promising method to detect the defects of color filter. The proposed algorithm can apply to not only the detection of color filter but also the detection of web materials.