Analysis of Josephson Junction Lifetimes for the Detection of Single Photons in a Thermal Noise Background

Abstract

This work deals with the numerical analysis of the zero-voltage state lifetimes distribution of an underdamped Josephson junction used for the detection of single microwave photons in the presence of thermal noise. The analysis considers the switching probabilities of a JJ subjected to a train of current pulses, which simulates a weak photon field. To characterize the detection, we take advantage of a statistic tool, the Kumar-Carroll (KC) index, which is a good proxy of the signal-to-noise-ratio. It can be, therefore, exploited to identify the proper device fabrication parameters and the optimal operation point of the junction.