Effective fault localization via mutation analysis: a selective mutation approach

Mike Papadakis, Yves Le Traon
{"title":"Effective fault localization via mutation analysis: a selective mutation approach","authors":"Mike Papadakis, Yves Le Traon","doi":"10.1145/2554850.2554978","DOIUrl":null,"url":null,"abstract":"When programs fail, developers face the problem of identifying the code fragments responsible for this failure. To this end, fault localization techniques try to identify suspicious program places (program statements) by observing the spectrum of the failing and passing test executions. These statements are then pointed out to assist the debugging activity. This paper considers mutation-based fault localization and suggests the use of a sufficient mutant set to locate effectively the faulty statements. Experimentation reveals that mutation-based fault localization is significantly more effective than current state-of-the-art fault localization techniques. Additionally, the results show that the proposed approach is capable of reducing the overheads of mutation analysis. In particular the number of mutants to be considered is reduced to 20% with only a limited loss on the method's effectiveness.","PeriodicalId":285655,"journal":{"name":"Proceedings of the 29th Annual ACM Symposium on Applied Computing","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"51","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 29th Annual ACM Symposium on Applied Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2554850.2554978","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 51

Abstract

When programs fail, developers face the problem of identifying the code fragments responsible for this failure. To this end, fault localization techniques try to identify suspicious program places (program statements) by observing the spectrum of the failing and passing test executions. These statements are then pointed out to assist the debugging activity. This paper considers mutation-based fault localization and suggests the use of a sufficient mutant set to locate effectively the faulty statements. Experimentation reveals that mutation-based fault localization is significantly more effective than current state-of-the-art fault localization techniques. Additionally, the results show that the proposed approach is capable of reducing the overheads of mutation analysis. In particular the number of mutants to be considered is reduced to 20% with only a limited loss on the method's effectiveness.
基于突变分析的有效故障定位:一种选择性突变方法
当程序失败时,开发人员面临着识别导致该失败的代码片段的问题。为此,故障定位技术试图通过观察失败和通过测试执行的范围来识别可疑的程序位置(程序语句)。然后指出这些语句以帮助调试活动。本文考虑了基于突变的故障定位,提出了利用充分突变集对故障语句进行有效定位的方法。实验表明,基于突变的故障定位方法比现有的故障定位方法更有效。此外,结果表明,该方法能够减少突变分析的开销。特别是要考虑的突变体数量减少到20%,对方法的有效性只有有限的损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信