Precise Time Synchronization in Semiconductor Manufacturing

V. Anandarajah, N. Kalappa, R. Sangole, Safiullah Hussaini, Ya-Shian Li, J. Baboud, J. Moyne
{"title":"Precise Time Synchronization in Semiconductor Manufacturing","authors":"V. Anandarajah, N. Kalappa, R. Sangole, Safiullah Hussaini, Ya-Shian Li, J. Baboud, J. Moyne","doi":"10.1109/ISPCS.2007.4383777","DOIUrl":null,"url":null,"abstract":"In today's semiconductor fabrication facilities (\"fabs\"), coordination of time-based information throughout the factory and enterprise has become necessary to support fab-wide diagnostics, control, and information management. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as network time protocol (NTP) and precision time protocol (PTP) have been defined for performing synchronization over distributed systems. Lack of time synchronization among the various subsystems is seen as a factor of poor data quality in equipment data acquisition (EDA) and advanced process control (A PC) analysis. The focus of our study is to investigate the extent and precision of time synchronization that can be practically applied with the available protocols at various levels of the semiconductor factory environment to meet next generation manufacturing requirements. To this end, we describe the objectives, details, and implementation of the simulator that aims to model a semiconductor factory network This will provide a practical perspective to study the accuracy achievable and potential network factors contributing to accuracy degradation of factory-wide time synchronization.","PeriodicalId":258197,"journal":{"name":"2007 IEEE International Symposium on Precision Clock Synchronization for Measurement, Control and Communication","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Symposium on Precision Clock Synchronization for Measurement, Control and Communication","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPCS.2007.4383777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

In today's semiconductor fabrication facilities ("fabs"), coordination of time-based information throughout the factory and enterprise has become necessary to support fab-wide diagnostics, control, and information management. This has driven the need to have time synchronization at all levels of the enterprise. Time synchronization protocols such as network time protocol (NTP) and precision time protocol (PTP) have been defined for performing synchronization over distributed systems. Lack of time synchronization among the various subsystems is seen as a factor of poor data quality in equipment data acquisition (EDA) and advanced process control (A PC) analysis. The focus of our study is to investigate the extent and precision of time synchronization that can be practically applied with the available protocols at various levels of the semiconductor factory environment to meet next generation manufacturing requirements. To this end, we describe the objectives, details, and implementation of the simulator that aims to model a semiconductor factory network This will provide a practical perspective to study the accuracy achievable and potential network factors contributing to accuracy degradation of factory-wide time synchronization.
半导体制造中的精确时间同步
在今天的半导体制造设施(“晶圆厂”)中,整个工厂和企业中基于时间的信息的协调已经成为支持晶圆厂范围的诊断、控制和信息管理的必要条件。这就需要在企业的所有层次上进行时间同步。时间同步协议,如网络时间协议(NTP)和精确时间协议(PTP)已经被定义为在分布式系统上执行同步。在设备数据采集(EDA)和高级过程控制(PC)分析中,各个子系统之间缺乏时间同步被视为数据质量差的一个因素。我们研究的重点是调查时间同步的范围和精度,可以实际应用于半导体工厂环境的各级可用协议,以满足下一代制造要求。为此,我们描述了旨在模拟半导体工厂网络的模拟器的目标、细节和实现,这将为研究可实现的精度和潜在的网络因素提供一个实用的视角,这些因素会导致工厂范围内时间同步的精度下降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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