Property-checking based LBIST for improved diagnosability

Abstract

We propose a new property-checking-based LBIST architecture which uses hardware monitors to check certain properties in the output responses. If any property is violated, the failing property number is stored for diagnosis. The proposed architecture improves diagnosability considerably with minimal hardware overhead. Experimental results show that the diagnostic resolution achieved by our architecture is comparable to that achieved in a non-BIST setup for many circuits.